Prof. Manu Malek, AT&T Lucent Bell Labs, USA/IEEE Life Fellow
Prof. Tamaki Ura, Tokyo University, Japan/IEEE Fellow
Prof. Yuki Fukumoto, Panasonic Co., Japan
Prof. Ce Zhu, University of Electronic Science and Technology, China/IEEE Fellow
Prof. Cheng-Lin Liu, Chinese Academy of Sciences, China/IEEE Fellow
Prof. Geoffrey C. Fox, Indiana University, USA/ACM Fellow
Prof. Pin-Han Ho, University of Waterloo, Canada/IEEE Fellow
Prof. Chang-Wen Chen, State University of New York, USA/IEEE Fellow
Prof. Xiaofang Zhou, The University of Queensland, Australia/IEEE Fellow
Prof. Mohsen Guizani, University of Idaho, USA/IEEE Fellow
Prof. Xiaoqing Wen, Kyushu Institute of Technology, Japan/IEEE Fellow
Prof. Imrich Chlamtac, University of Trento, Italy/IEEE-ACM Fellow
Prof. Dapeng Oliver Wu, University of Florida, USA/IEEE Fellow
Prof. Hongbin Zha, Peking University, China
Prof. Jianru Xue, Xi’an Jiaotong University, China
Prof. Hengtao Shen, Univ. of Elec. Sci. and Technology, China/OSA Fellow
Prof. Dacheng Tao, The University of Sydney, Australia/IEEE-ACM Fellow
Prof. Edwin Hancock, University of York, UK/IEEE Fellow
Prof. Schahram Dustdar, Vienna University of Technology, Austria/IEEE Fellow
Prof. Feiyue Wang, Chinese Academy of Sciences, China/IEEE Fellow
Prof. Liang Wang, Chinese Academy of Sciences, China/IEEE Fellow
Prof. Xuemin (Sherman) Shen, University of Waterloo, Canada/IEEE Fellow
Prof. Yasushi Yagi, Osaka University, Japan/IPSJ Fellow
Prof. Mengchu Zhou, New Jersey Institute of Technology/IEEE-AAAS Fellow
Prof. Xizhao Wang, Shenzhen University/IEEE Fellow
Prof. Peter Xiaoping Liu, Carleton University, Canada/IEEE Fellow
Prof. Min Chen, Huazhong Univ. of Science and Technology, China/IEEE Fellow
Prof. Nikhil R. Pal, Indian Statistical Institute, India/IEEE Fellow
Prof. Fuchun Sun, Tsinghua University, China/IEEE Fellow
Prof. Yanchun Zhang, Victoria University, Australia
Prof. Mahmoud Daneshmand, Stevens Institute of Technology, USA/IEEE Fellow
Prof. Mo Jamshidi, The University of Texas at San Antonio, USA/IEEE Fellow
ERiC Laboratory 